Contact
+49 711 685 67362
+49 711 685 67362
Email
Pfaffenwaldring 47
70569 Stuttgart
Deutschland
Room: 2.278
Subject
- Variable selection and feature selection using deep learning
- Feature mask module
- Attention-based approaches
- Sparsity-based approaches
- etc.
- Anomaly detection using deep learning
- One-class classification and open set recognition
- Fault detection and recovery in autonomous systems
- Intra-class splitting
2022
Yiwen Liao, Raphaël Latty, Paul R. Genssler, Hussam Amrouch and Bin Yang
Wafer Map Defect Classification Based on the Fusion of Pattern and Pixel Information
To appear at IEEE International Test Conference (ITC), 2022, Disneyland, Anaheim, US
Yiwen Liao, Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich and Bin Yang
Efficient and Robust Resistive Open Defect Detection based on Unsupervised Deep Learning
To appear at IEEE International Test Conference (ITC), 2022, Disneyland, Anaheim, US
Yiwen Liao and Bin Yang
To appear at International Joint Conference on Neural Networks (IJCNN) and IEEE World Congress on Computational Intelligence (WCCI), 2022, Padua, Italy
Yiwen Liao, Tianjie Ge, Raphaël Latty and Bin Yang
In the 1st Workshop on Intelligent Methods for Test and Reliability, co-organized with IEEE European Test Symposium (ETS), 2022, Barcelona, Spain
H. Amrouch, J. Anders, A. Atteya, S. Becker, M. Betka, G. Bleher, P. Domanski, N. Elhamawy, T. Ertl, A. Gatzastras, P. Genssler, S. Hasler, M. Heinrich, A. van Hoorn, H. Jafarzadeh, I. Kallfass, F. Klemme, S. Koch, R. Küsters, A. Lalama, R. Latty, Y. Liao, N. Lylina, Z. Najafi Haghi, D. Pflüger, I. Polian, J. Rivoir, M. Sauer, D. Schwachhofer, S. Templin, C. Volmer, S. Wagner, D. Weiskopf, H.-J. Wunderlich, B. Yang, M. Zimmermann
Design, Automation and Test in Europe Conference (DATE), 2022, Antwerp, Belgium
Yiwen Liao, Jochen Rivoir, Raphaël Latty and Bin Yang
In the 34th Workshop on Test Methods and Reliability of Circuits and Systems (TuZ 2022), 2022, Bremerhaven, Germany
2021
Yiwen Liao, Abdullah Yeaser, Bin Yang, James Tung, Ehsan Hashemi
Robotics and Autonomous Systems, 2021, Elsevier
Yiwen Liao, Alexander Bartler, Bin Yang
IEEE International Conference on Automation Science and Engineering (CASE), 2021, Lyon, France
Yiwen Liao, Raphaël Latty, Bin Yang
International Joint Conference on Neural Networks (IJCNN), July 2021, virtual, China
2020
Tomas Ertl, Steffen Koch, Andres Lalama, Yiwen Liao, Dirk Pflüger, Daniel Weiskopf, Bin Yang
Intelligent Post Silicon Validation
32. Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Sytemen, 2020
Yiwen Liao, Ehsan Hashemi, Tong Wang, Bin Yang
IEEE Systems Journal, 2020, IEEE
Patrick Schlachter*, Yiwen Liao* and Bin Yang
SN Computer Science, 2020, Springer
* These authors contributed equally.
The following studies were accomplished during my master and bachelor study
Patrick Schlachter, Yiwen Liao and Bin Yang
IEEE European Signal Processing Conference (EUSIPCO), September 2019, A Coruña, Spain.
Patrick Schlachter, Yiwen Liao and Bin Yang
One-Class Feature Learning Using Intra-Class Splitting
One-Class Feature Learning Using Intra-Class Splitting
IEEE European Signal Processing Conference (EUSIPCO), September 2019, A Coruña, Spain.
Patrick Schlachter, Yiwen Liao and Bin Yang
IEEE Data Science Workshop (DSW), June 2019, Minneapolis, Minnesota, USA.
Chunlai Wang, Bin Yang and Yiwen Liao
IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), March 2017, New Orleans, LA, USA
- Review for IEEE Transactions on Neural Networks and Learning Systems (TNNLS)
- Review for IEEE Transactions on Industrial Informatics (TII)
- Review for IEEE Robotics and Automation Letters (RA-L)
- Review for IEEE International Conference on Robotics and Automation (ICRA)
- Review for International Conference on Artificial Intelligence and Statistics (AISTATS)
- Review for International Joint Conference on Neural Networks (IJCNN)
- Review for IEEE International Conference on Automation Science and Engineering (CASE)
- Review for European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases (ECMLPKDD)