Kontakt
Pfaffenwaldring 47
70569 Stuttgart
Deutschland
Raum: 2.252
Fachgebiet
- One-class classification
- Anomaly detection
- Open-set recognition
Patrick Schlachter*, Yiwen Liao* and Bin Yang
SN Computer Science, 2020, Springer.
* These authors contributed equally.
Patrick Schlachter, Yiwen Liao and Bin Yang
IEEE European Signal Processing Conference (EUSIPCO), September 2019, A Coruña, Spain.
Patrick Schlachter, Yiwen Liao and Bin Yang
One-Class Feature Learning Using Intra-Class Splitting
One-Class Feature Learning Using Intra-Class Splitting
IEEE European Signal Processing Conference (EUSIPCO), September 2019, A Coruña, Spain.
Patrick Schlachter, Yiwen Liao and Bin Yang
IEEE Data Science Workshop (DSW), June 2019, Minneapolis, Minnesota, USA.
Patrick Schlachter and Bin Yang
Active Learning for One-Class Classification
Using Two One-Class Classifiers
IEEE European Signal Processing Conference (EUSIPCO), September 2018, Rome, Italy.
IEEE European Signal Processing Conference (EUSIPCO), September 2018, Rome, Italy.